Features:
- Atmospheric pressure operation (unique in the world)
- Estimate work function, ionization potential, density of states (DOS)
- Measure thickness of thin films on the material surface (less than 20 nano-meters)
- Measure the sample of powder and liquid
- Low photo-excitation energy (4.0 – 7.0eV)
- Measurement for just 5 minutes
- Easy sample introduction and removal
- Full computer control
- Easy to measure the Density of States (DOS) around the highest occupied orbital, work function and ionization potential
- Information for tiny surface on nanometer order and tiny thin film thickness (0-20nm) can be measured
- Powder and liquid samples which are unable to bring into the vacuum also can be measured
- Measurement taken in just 5 minutes (when measured in 5.0 – 7.0eV energy search range with step 0.1eV)
Application/s:
- Measurement of ionization potential on organic materials used in solar cell, fuel cell organic EL and organic TFT
- Measurement of ionization potential on photocatalyst
- Evaluation of MgO film quality on plasma display panel (PDP)
- Measurement of electronic states for carbon nanotube and fullerene
- Measurement of electronic states on carbon thin film and diamond thin film
- Measurement of electronic states for cosmetics, medicine and chemicals
- Measurement of ionization potential on sensitive materials
- Measurement of contamination and oxidized film thickness for electrode, lead frame, contacts, steel plate, silicon wafer and compound semiconductor wafer
- Measurement of work function on metallic materials for various electrodes
Overview:
The newly developed AC-3 has been designed as a photoelectron spectrophotometer in atmospheric pressure conditions by applying the open counter as an electron detector. The unit has been marketed mainly to the study of organo-electronic materials for organic EL and photocopying.
Additional Benefits:
- Easy to measure the Density of States (DOS) around the highest occupied orbital, work function and ionization potential.
- Information for tiny surface on nanometer order and tiny thin film thickness (0-20nm) can be measured
- Powder and liquid samples which are unable to bring into the vacuum also can be measured
- Measurement taken in just 5 minutes (when measured in 5.0 – 7.0eV energy search range with step 0.1eV)
Specifications:
| Model | AC-3 |
| Measuring Principle | Low energy electron counter method |
| Electron Detector | Open counter |
| Ultraviolet Lamp | Deuterium lamp with lamp house |
| Spectrometer | Nitrogen substitution type grating method monochrometer |
| Energy Search Range | 4.0 – 7.0eV (310 – 177nm) |
| Operating Condition | 15 – 35°C, below 60% RH |
| Repeatability Precision
(Standard Deviation) |
Work function 0.02eV |
| Measuring Time | Approx 5 minutes (when measuring in 5.0 – 7.0eV energy scanning range with step
0.1eV) |
| Radiating Ultraviolet Rays | Spot size: 2 x 5mm (slit 1.00mm)
Maximum intensity: above 100nW (at 5.9eV) |
| Sample Size | 30 x 30mm max (max thickness 10mm), 1 sample measurement |
| Utility Required | Power source: 100 VAC, 50/60 Hz, 5A (max)
Compressed Air: 0.5 – 0.6MPa, 5L/min Nitrogen Gas: 0.1MPa, 2L/min (while measured), 5L/min (while purging) |
| Software | AC-3 for Windows (functions to measure photoelectron spectrum, radiation light
spectrum, threshold energy etc) |
| Approvals | CE |
| Overall Dimensions | Approx 740 (w) x 1080 (h) x 680 (d) mm (with casters) |
| Weight | Approx 120 kg |
- Overview
-
Overview:
The newly developed AC-3 has been designed as a photoelectron spectrophotometer in atmospheric pressure conditions by applying the open counter as an electron detector. The unit has been marketed mainly to the study of organo-electronic materials for organic EL and photocopying.
Additional Benefits:
- Easy to measure the Density of States (DOS) around the highest occupied orbital, work function and ionization potential.
- Information for tiny surface on nanometer order and tiny thin film thickness (0-20nm) can be measured
- Powder and liquid samples which are unable to bring into the vacuum also can be measured
- Measurement taken in just 5 minutes (when measured in 5.0 – 7.0eV energy search range with step 0.1eV)
- Specifications
-
Specifications:
Model AC-3 Measuring Principle Low energy electron counter method Electron Detector Open counter Ultraviolet Lamp Deuterium lamp with lamp house Spectrometer Nitrogen substitution type grating method monochrometer Energy Search Range 4.0 – 7.0eV (310 – 177nm) Operating Condition 15 – 35°C, below 60% RH Repeatability Precision (Standard Deviation)
Work function 0.02eV Measuring Time Approx 5 minutes (when measuring in 5.0 – 7.0eV energy scanning range with step 0.1eV)
Radiating Ultraviolet Rays Spot size: 2 x 5mm (slit 1.00mm) Maximum intensity: above 100nW (at 5.9eV)
Sample Size 30 x 30mm max (max thickness 10mm), 1 sample measurement Utility Required Power source: 100 VAC, 50/60 Hz, 5A (max) Compressed Air: 0.5 – 0.6MPa, 5L/min
Nitrogen Gas: 0.1MPa, 2L/min (while measured), 5L/min (while purging)
Software AC-3 for Windows (functions to measure photoelectron spectrum, radiation light spectrum, threshold energy etc)
Approvals CE Overall Dimensions Approx 740 (w) x 1080 (h) x 680 (d) mm (with casters) Weight Approx 120 kg - Downloads
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